Application of Plasma Ignition Technology in High Voltage Synthetic Tests

LI Gang; YAO Yuan; YAO Sili; LIU Ping; LIU Pu; WANG Peiren; YAN Duifeng

doi:10.13296/j.1001-1609.hva.2018.04.029

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Application of Plasma Ignition Technology in High Voltage Synthetic Tests

更新时间：2025-04-26

- Application of Plasma Ignition Technology in High Voltage Synthetic Tests
- High VoltageApparatus Vol. 54, Issue 4, Pages: 195-200(2018)
- 作者机构：
  
  西安高压电器研究院有限责任公司
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2018.04.029
  CLC： TM561
- Published：2018
- 稿件说明：
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[1]李刚,姚远,姚斯立,刘平,刘朴,王培人,阎对丰.等离子点火技术在高压合成试验中的应用[J].高压电器,2018,54(04):195-200.

LI Gang, YAO Yuan, YAO Sili, et al. Application of Plasma Ignition Technology in High Voltage Synthetic Tests[J]. High voltageapparatus, 2018, 54(4): 195-200.
[1]李刚,姚远,姚斯立,刘平,刘朴,王培人,阎对丰.等离子点火技术在高压合成试验中的应用[J].高压电器,2018,54(04):195-200. DOI： 10.13296/j.1001-1609.hva.2018.04.029.

LI Gang, YAO Yuan, YAO Sili, et al. Application of Plasma Ignition Technology in High Voltage Synthetic Tests[J]. High voltageapparatus, 2018, 54(4): 195-200. DOI： 10.13296/j.1001-1609.hva.2018.04.029.

摘要

火花间隙是高压合成试验回路中的一个关键设备

目前其点火方式存在抗干扰能力弱

触发可靠性低

操作频繁等问题。文中将等离子点火技术应用于高压电器试验触发系统之中

通过对等离子点火技术的原理进行分析

设计并试制了点火装置样机

在实验室中进行了调试及运行

最终验证了等离子点火装置触发可靠性高

抗干扰能力强、时延低、时延分散性小

能有效提高常规高压合成试验及特高压合成试验的安全性及效率。

Abstract

The spark gap is a key device of high voltage synthetic test circuit

its current ignition method has manyproblems

such as weak anti-interference ability

low triggering reliability

high operating frequency

and so on. Inthis paper

plasma ignition technology is applied to the test trigger system of high voltage electrical apparatus

by us-ing the principle of the plasma ignition technology

the ignition device is designed and trial-manufactured

by testingand running in the high voltage spark gap in the laboratorial

the device is finally proved to be high triggering reliabil-ity

strong anti-interference ability

low time delay

and small delay dispersibility. This device can effectively im-prove efficiency and safety of usual high-voltage and ultra-high-voltage synthetic test.

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西安高压电器研究所

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