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Electric Field Simulation of GIS Insulators Typical Defects
更新时间:2025-04-26
    • Electric Field Simulation of GIS Insulators Typical Defects

    • High VoltageApparatus   Vol. 54, Issue 5, Pages: 138-143(2018)
    • DOI:10.13296/j.1001-1609.hva.2018.05.022    

      CLC: TM216
    • Published:2018

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  • CHANG Wenzhi, BI Jiangang, LIU Shupin, et al. Electric Field Simulation of GIS Insulators Typical Defects[J]. High voltageapparatus, 2018, 54(5): 138-143. DOI: 10.13296/j.1001-1609.hva.2018.05.022.

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