Analysis for Electrical Properties of Gas Insulated Transmission Line（GIL）Conductor with Interference Fit Structure

LI Kai; SI Xiaochuang; XU Zhongxun; SONG Jiguang; MIAO Xiaojun

doi:10.13296/j.1001-1609.hva.2018.08.026

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Analysis for Electrical Properties of Gas Insulated Transmission Line（GIL）Conductor with Interference Fit Structure

更新时间：2025-04-26

- Analysis for Electrical Properties of Gas Insulated Transmission Line（GIL）Conductor with Interference Fit Structure
- High VoltageApparatus Vol. 54, Issue 8, Pages: 168-173(2018)
- 作者机构：
  
  平高集团有限公司
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2018.08.026
  CLC： TM75
- Published：2018
- 稿件说明：
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[1]李凯,司晓闯,徐仲勋,宋继光,苗晓军.GIL导体过盈连接结构电性能分析[J].高压电器,2018,54(08):168-173.

LI Kai, SI Xiaochuang, XU Zhongxun, et al. Analysis for Electrical Properties of Gas Insulated Transmission Line（GIL）Conductor with Interference Fit Structure[J]. High voltageapparatus, 2018, 54(8): 168-173.
[1]李凯,司晓闯,徐仲勋,宋继光,苗晓军.GIL导体过盈连接结构电性能分析[J].高压电器,2018,54(08):168-173. DOI： 10.13296/j.1001-1609.hva.2018.08.026.

LI Kai, SI Xiaochuang, XU Zhongxun, et al. Analysis for Electrical Properties of Gas Insulated Transmission Line（GIL）Conductor with Interference Fit Structure[J]. High voltageapparatus, 2018, 54(8): 168-173. DOI： 10.13296/j.1001-1609.hva.2018.08.026.

摘要

为了验证低成本、高效率的过盈连接结构替代现有的焊接结构应用于GIL导体制造的可行性

对过盈连接结构的导体进行电性能分析研究。采用回路电阻测试仪测试了不同结构、不同制备工艺的导体的回路电阻

并利用Ansys对过盈连接结构的接触特性进行了仿真分析

然后选取合适的过盈连接结构和焊接结构一块进行了通流能力试验验证。结果表明:过盈量为0.15 mm的过盈连接结构的回路电阻与焊接结构相近

温升试验、短时耐受和峰值耐受电流试验结果合格

可以替代焊接连接结构用于GIL超长导体的制造

提高制造效率。

Abstract

In order to test and verify the feasibility of using low-cost

high-efficiency interference fit structure instead of conventional welded structure for GIL conductor manufacturing

electrical properties of conductors with interference bonding structures are analyzed. Loop resistances of conductors with different structures and different preparation processes are tested using loop resistance test instrument

the contact characteristics of interference fit structure analyzed using Ansys software

and then

a suitable interference fit structure and welded structure are selected for verification of current carrying capacity. The results show that the loop resistance of interference fit structure with 0.15 mm interference value and welded structure are similar

the results of temperature rise test

shorttime withstand test and peak withstand test are authorized

interference fit structure can instead of conventional welded structure in GIL manufacturing to improve manufacturing efficiency.

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Related Author

ZHONG Jianying

HAO Liucheng

LI Kai

XU Dongjie

LI Shanguang

GUO Xiuhua

ZHANG Yanmin

MIAO Xiaojun

Related Institution

School of Materials Science and Engineering, Henan University of Science and Technology

ABB China HV Technology Center

ABB Corporate Research

State Key Laboratory of Advanced Electromagnetic Engineering and Technology,College of Electrical and Electronic Engineering,Huazhong University of Science and Technology

ALSTOM Grid Technology Center Co.,Ltd.

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