CHENG Dengfeng, LI Mingzhe, XIA Lingzhi, et al. Research on Natural Contamination Simulated by Artificial Contamination Test Methods for Glass Insulator[J]. High voltageapparatus, 2018, 54(10): 69-75.
CHENG Dengfeng, LI Mingzhe, XIA Lingzhi, et al. Research on Natural Contamination Simulated by Artificial Contamination Test Methods for Glass Insulator[J]. High voltageapparatus, 2018, 54(10): 69-75. DOI: 10.13296/j.1001-1609.hva.2018.10.012.
Research on Natural Contamination Simulated by Artificial Contamination Test Methods for Glass Insulator
the equivalence between natural contamination and artifi-cial contamination tests hasn’t been satisfactorily solved
the flashover voltages obtained from the natural contamina-tion tests are always slightly higher than that obtained by the artificial contamination tests. In this paper
the naturalcontamination tests and the artificial tests of glass insulators had been carried out in the Kunming UHV test base. Byusing the flashover voltages as index
three different ways of contamination brushing by the ESDD and NSDD are de-signed
the influence of different contamination brushing methods on the equivalence between artificial contamina-tion test and natural contamination test is studied. Based on that
the influences of contamination brushing by the saltcomposition and by the surface conductivity on the flashover voltage are studied to find the contamination brushingmethod which has the closest flashover voltage to the natural contamination. Test results show that brushing contami-nation by the overall ESDD and NSDD is the most convenient way
brushing contamination by the surface conductivi-ty has the closest flashover voltage with the natural contamination tests
brushing contamination by the salt composi-tion times. Furthermore
in order to analyze the reasons for the difference between the flashover voltage of artificialcontamination test and natural contamination test
the influences of salt composition and contamination distributionon flashover voltage are investigated.