Detection and Analysis of Several Partial Discharge Defects of Insulation in GIS

SONG Dongbo; QIN Shaorui; CHEN Fan; WEI Cunjin; MA Linsheng; WANG Longlong; XIA Shande

doi:10.13296/j.1001-1609.hva.2018.11.022

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Detection and Analysis of Several Partial Discharge Defects of Insulation in GIS

更新时间：2025-04-26

- Detection and Analysis of Several Partial Discharge Defects of Insulation in GIS
- High VoltageApparatus Vol. 54, Issue 11, Pages: 153-159(2018)
- 作者机构：
  
  1. 国网安徽省电力有限公司电力科学研究院
  2. 国网安徽省电力有限公司阜阳供电公司
  3. 上海格鲁布科技有限公司
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2018.11.022
  CLC： TM855
- Published：2018
- 稿件说明：
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[1]宋东波,秦少瑞,陈凡,魏存金,马林生,王龙龙,夏善德.几起GIS绝缘件局部放电缺陷的检测与分析[J].高压电器,2018,54(11):153-159.

SONG Dongbo, QIN Shaorui, CHEN Fan, et al. Detection and Analysis of Several Partial Discharge Defects of Insulation in GIS[J]. High voltageapparatus, 2018, 54(11): 153-159.
[1]宋东波,秦少瑞,陈凡,魏存金,马林生,王龙龙,夏善德.几起GIS绝缘件局部放电缺陷的检测与分析[J].高压电器,2018,54(11):153-159. DOI： 10.13296/j.1001-1609.hva.2018.11.022.

SONG Dongbo, QIN Shaorui, CHEN Fan, et al. Detection and Analysis of Several Partial Discharge Defects of Insulation in GIS[J]. High voltageapparatus, 2018, 54(11): 153-159. DOI： 10.13296/j.1001-1609.hva.2018.11.022.

摘要

对GIS开展局部放电检测与分析

能为其绝缘状态的评估提供依据

另外根据放电谱图的特征还可对缺陷类型进行识别。绝缘件缺陷是导致GIS产生局部放电的典型缺陷之一

文中介绍了利用局部放电检测发现的几起GIS绝缘件内部缺陷

基于特高频检测技术准确判断了缺陷类型并对缺陷位置进行了定位

分析发现固体绝缘与金属件接触面上的气隙是产生局部放电根本原因

为该类缺陷的检测分析提供借鉴。

Abstract

Partial discharge（PD）detection and analysis can be used to evaluate the insulation condition of GIS. Insulation defects are one of the typical defects that lead to PD in GIS

and the defect types can be identified according tothe characteristics of the PD pattern. In this paper

several insulation defects in GIS are discussed. Based on the ul-tra high frequency（UHF）detection technology

these defect types are accurately determined and the locations of thedefects are located. It is found that the void between the contact surface of solid insulation and metal part is the root cause of PD. This research may provide a reference for detection and analysis of such defects.

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