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Non-destructive Testing Technology of the Cracking Failure of the Basin-type Insulator
更新时间:2025-04-26
    • Non-destructive Testing Technology of the Cracking Failure of the Basin-type Insulator

    • High VoltageApparatus   Vol. 55, Issue 3, Pages: 139-143(2019)
    • DOI:10.13296/j.1001-1609.hva.2019.03.022    

      CLC: TM216
    • Published:2019

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  • LIU Ronghai, ZANG Chunyan, YANG Yingchun, et al. Non-destructive Testing Technology of the Cracking Failure of the Basin-type Insulator[J]. High voltageapparatus, 2019, 55(3): 139-143. DOI: 10.13296/j.1001-1609.hva.2019.03.022.

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