The phenomenon of secondary electron emission of solid insulation materials will lead to electron multiplication and charge accumulation

and it will finally result in the failure of electrical device.The measurement of secondary electron emission yield for solid insulation materials is important to guide material selection and evaluate material properties.The difference of secondary electron generation

transport

and emission between the insulation and metal materials is compared firstly in this paper.Then the existing measurement methods for secondary electron emission yield of insulation materials are summarized.The influencing factors on the secondary electron emission measurement and surface charge accumulation

are analyzed

including the primary electron energy

beam current

incident angle

material surface state

and so on.The average free path of primary electrons in the insulation materials is much larger than that of secondary electrons

so only small part of secondary electrons excited by primary electrons could escape from the insulation surface.The accumulated charges will further affect the secondary electron emission of insulation surface by changing the primary and secondary electron energy.At last

it will reach a charged state of dynamic balance.Thus the charge neutralization is key technology in secondary electron measurement for insulation materials.The mostly used methods include heating and electron beam irradiation

but the quantitative elimination for the accumulated charge is still difficult.How to remove the accumulated charge effectively is important to improve the accuracy and repeatability of secondary electron emission measurement device.