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Application of X-ray Image Recognition Technology in GIS Defect Diagnosis
更新时间:2025-04-26
    • Application of X-ray Image Recognition Technology in GIS Defect Diagnosis

    • High VoltageApparatus   Vol. 55, Issue 6, Pages: 62-69(2019)
    • DOI:10.13296/j.1001-1609.hva.2019.06.009    

      CLC: TM595
    • Published:2019

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  • LIU Ronghai, YANG Yingchun, GENG Leizhao, et al. Application of X-ray Image Recognition Technology in GIS Defect Diagnosis[J]. High voltageapparatus, 2019, 55(6): 62-69. DOI: 10.13296/j.1001-1609.hva.2019.06.009.

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Related Author

GENG Leizhao
LIU Ronghai
TANG Faqing
WAN Shuting
YANG Yingchun
WANG Zhicong
LIU Rujian
DENG Dongyin

Related Institution

Shandong Taikai High-voltage Switchgear Co., Ltd.
Shandong University of Technology
College of Electrical Engineering, Sichuan University
State Grid Ningxia Electric Power Corporation Research Institute
Super High Voltage Company of State Grid Henan Electric Power Company
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