YANG Xu, ZHANG Changhong, LI Weiguo, et al. Analysis on Restrike Faults Occurring in Class C2 Back-to-back Capacitor Bank Switching Tests of 500 kV ACF Circuit Breakers[J]. High voltageapparatus, 2019, 55(12): 240-247.
YANG Xu, ZHANG Changhong, LI Weiguo, et al. Analysis on Restrike Faults Occurring in Class C2 Back-to-back Capacitor Bank Switching Tests of 500 kV ACF Circuit Breakers[J]. High voltageapparatus, 2019, 55(12): 240-247. DOI: 10.13296/j.1001-1609.hva.2019.12.036.
Analysis on Restrike Faults Occurring in Class C2 Back-to-back Capacitor Bank Switching Tests of 500 kV ACF Circuit Breakers
The restrike faults occurred during class C2 back-to-back capacitor bank switching tests for ACF circuit breakers are analyzed.The testing parameters selected for the tests are much stricter than those recommended in the national standard.The causes of the faults are explored through tracking the whole process of fault recording and flashover developing paths
and detecting the key components.Further
disintegration and electric field simulation of the main parts are conducted for the fault analysis.It is concluded that there are three main reasons for the faults:1)1/2 pole closing test resulted in the uneven erosion distribution between two breaks;2) the metal chips from mechanical abrasion due to frequent switching reduced the insulation strength in a short interrupting instant;and 3) the inner damages of grading capacitors led to uneven voltage distribution between breakers.In addition
the ways to improve the design of ACF circuit breaker and optimize the procedure of the class C2 switching test are offered.