Review on Aging Mechanism and Condition Monitoring of Devices in MMC Sub-module

ZHANG Jian; CHEN Rui; CHEN Shiying; ZHU Lingyu; PAN Liang; LIU Chenshuo

doi:10.13296/j.1001-1609.hva.2020.01.001

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Review on Aging Mechanism and Condition Monitoring of Devices in MMC Sub-module

更新时间：2025-04-26

- Review on Aging Mechanism and Condition Monitoring of Devices in MMC Sub-module
- High VoltageApparatus Vol. 56, Issue 1, Pages: 1-8(2020)
- 作者机构：
  
  1. 广东电网有限责任公司电力科学研究院
  2. 西安交通大学电力设备电气绝缘国家重点实验室
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2020.01.001
  CLC： TM721.1
- Published：2020
- 稿件说明：
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[1]张健,陈锐,陈世瑛,祝令瑜,潘亮,刘琛硕.MMC子模块设备老化机理与状态监测研究综述[J].高压电器,2020,56(01):1-8.

ZHANG Jian, CHEN Rui, CHEN Shiying, et al. Review on Aging Mechanism and Condition Monitoring of Devices in MMC Sub-module[J]. High voltageapparatus, 2020, 56(1): 1-8.
[1]张健,陈锐,陈世瑛,祝令瑜,潘亮,刘琛硕.MMC子模块设备老化机理与状态监测研究综述[J].高压电器,2020,56(01):1-8. DOI： 10.13296/j.1001-1609.hva.2020.01.001.

ZHANG Jian, CHEN Rui, CHEN Shiying, et al. Review on Aging Mechanism and Condition Monitoring of Devices in MMC Sub-module[J]. High voltageapparatus, 2020, 56(1): 1-8. DOI： 10.13296/j.1001-1609.hva.2020.01.001.

摘要

模块化多电平换流器（modular multilevel converter

MMC）是柔性直流输电的核心装置

其安全稳定运行对多端柔性直流输电系统的安全具有重要意义。MMC中重要功率设备绝缘栅双极型晶体管（insulated gate bipolar transistor

IGBT）和金属化聚丙烯薄膜电容器（metallized polypropylene film capacitor

MPPF-Cap）在长期运行过程中逐渐老化

出现内部结构的异常

引起运行特y性参数一定趋势的改变

其工作性能劣化将影响MMC的运行性能。文中总结了国内外关于MMC子模块设备IGBT和MPPF-Cap的老化机理和状态监测方法的研究现状

介绍现有的结合MMC拓扑结构与运行特性的子模块电容器状态监测方法

并展望了MMC子模块设备状态监测与评估领域未来的研究方向。

Abstract

Modular Multilevel Converter（MMC）is the core equipment of the voltage source converter based highvoltage DC transmission. Its safe and stable operation is of great importance to the safety of multi-terminal DC trans-mission system. Insulating Gate Bipolar Transistors（IGBTs） and Metallized Polypropylene Film Capacitor（MPPF-Cap） both are important power devices in MMC. These devices age gradually during the long-term operation

whichresulting in abnormalities of internal structure and causing certain trend changes in the operating characteristics.These changes will affect working performance of the MMC. The aging mechanism and condition monitoring methodsof IGBTs and MPPF-Cap are summarized in this paper

and the condition monitoring methods of sub-module capaci-tor based on MMC topology and operating characteristics are introduced. The research prospect of MMC topology andoperating characteristics based condition monitoring methods are proposed.

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