ZHANG Changhong, YANG Xu, LI Weiguo, et al. Study on Cumulative Ablation Effect of Circuit Breaker due to Breaking Short-circuit Current[J]. High voltageapparatus, 2020, 56(2): 53-61.
ZHANG Changhong, YANG Xu, LI Weiguo, et al. Study on Cumulative Ablation Effect of Circuit Breaker due to Breaking Short-circuit Current[J]. High voltageapparatus, 2020, 56(2): 53-61. DOI: 10.13296/j.1001-1609.hva.2020.02.009.
Study on Cumulative Ablation Effect of Circuit Breaker due to Breaking Short-circuit Current
To accurately evaluate the ablation degree of contacts of a circuit breaker after repeatedly breaking shortcircuit current
four full-size 500 kV circuit breakers were investigated via electrical endurance tests with respect to the cumulative ablation effects of the contacts after interrupting short-circuit current
where dynamic contact resistance measurement(DRM) was adopted.The relationships of effective contact displacement
effective contact resistance
and cumulative current interrupting energy were established according to the variation of the contact ablation conditions in the electrical endurance tests.This study reveals the cumulative ablation effect of circuit breaker on its lifetime state
and may facilitate the condition evaluation of the circuit breaker chamber and the design of the maintenance strategy.