LIU Tong, LI Hongtao, LIU Jianjun, et al. Insulation Breakdown Fault Caused by Stress Crack of GIS Basin-type Insulator[J]. High voltageapparatus, 2020, 56(2): 240-245.
LIU Tong, LI Hongtao, LIU Jianjun, et al. Insulation Breakdown Fault Caused by Stress Crack of GIS Basin-type Insulator[J]. High voltageapparatus, 2020, 56(2): 240-245. DOI: 10.13296/j.1001-1609.hva.2020.02.036.
Insulation Breakdown Fault Caused by Stress Crack of GIS Basin-type Insulator
Gas Insulated Switchgear(GIS)equipment has been applied in the power system widely
and its safe and reliable operation is very important.In this paper
a case of insulation breakdown fault in spacing bus chamber(220 kV GIS)was introduced
using detection methods such as scanning electron microscope and energy spectrometer to analyze the fault causes.Combining the disassembly test and the assembly process check
the fault cause was affirmed.Extra stress was produced because of the misalignment of three phase conductor during assembly process
which caused cracks on basin-type insulator and finally led to breakdown fault.The prevention and control proposal was proposed according to the fault analysis conclusion.