LAN Zhijun, FAN Yongqiang, YUE Yonggang, et al. Defect Detection of Solid Insulating Material Based on Nanosecond Pulse Voltage[J]. High voltageapparatus, 2020, 56(3): 122-127.
LAN Zhijun, FAN Yongqiang, YUE Yonggang, et al. Defect Detection of Solid Insulating Material Based on Nanosecond Pulse Voltage[J]. High voltageapparatus, 2020, 56(3): 122-127. DOI: 10.13296/j.1001-1609.hva.2020.03.018.
Defect Detection of Solid Insulating Material Based on Nanosecond Pulse Voltage
a partial discharge detection platform with repeated frequency nanosecond pulse voltage is built.The amplitude of output voltage is 30 kV
the pulse front is 100 ns
the half-width is 120 ns
and the repetition frequency is 10 kHz.Under the excitation of nanosecond pulse voltage
defects of the test sample produce partial discharge.The number of partial discharge is consistent with the number of applied pulse.The repeatability of discharge is good.The discharge quantity and the initial discharge voltage are easy to be counted
the partial discharge parameters are easy to be extract.Under continuous pulse
the development of defective can be judged by the change process of the discharge quantities of the sample.Therefore
the nanosecond pulse voltage can be used to detect the insulation defect of the sample
and it is helpful to study the destruction process and mechanism of the solid insulating material under partial discharge.