SUN Wenxing, LIN Chunyao, CAI Linglong, et al. Research on Fault Diagnosis Technology of Transformer Inducting Oscillating Switching Impulse Voltage Test Based on Transfer Function Method[J]. High voltageapparatus, 2020, 56(6): 243-248.
SUN Wenxing, LIN Chunyao, CAI Linglong, et al. Research on Fault Diagnosis Technology of Transformer Inducting Oscillating Switching Impulse Voltage Test Based on Transfer Function Method[J]. High voltageapparatus, 2020, 56(6): 243-248. DOI: 10.13296/j.1001-1609.hva.2020.06.035.
Research on Fault Diagnosis Technology of Transformer Inducting Oscillating Switching Impulse Voltage Test Based on Transfer Function Method
The inducting oscillating switching impulse(OSI)test for on-site impulse withstand voltage test of trans-former has advantages in efficiency
modulating wave and decreasing the size of equipment. In order to investigatethe characteristics of the voltage transfer function of a transformer with a inter-turn short-circuit fault under Inductingoscillating switching impulse
this paper constructed the voltage transfer function of transformer under oscillatingswitching impulse
built a test model to simulate inter-turn short-circuit faults in transformer
and constructed a testsystem to carry on tests on the model. The results show that compared with no fault
the voltage transfer function of atransformer with a inter-turn short-circuit fault under OSI the frequency increases and the amplitude decreases of atthe extreme point. Besides
the more serious the inter-turn short-circuit fault is
the more obvious the change of the ex-treme point is. How the extreme point of the voltage transfer function of a transformer with a inter-turn short-circuit faultunder OSI changes which is concluded in this paper will help in transformer OSI test and insulation defect detecting.