ZHE Yongxiang, FENG Lun, MENG Kang, et al. Research of the Impacts on TRV Caused by Parameters of the Supply Circuit in Shunt Reactor Current Switching Tests[J]. High voltageapparatus, 2020, 56(8): 143-147.
ZHE Yongxiang, FENG Lun, MENG Kang, et al. Research of the Impacts on TRV Caused by Parameters of the Supply Circuit in Shunt Reactor Current Switching Tests[J]. High voltageapparatus, 2020, 56(8): 143-147. DOI: 10.13296/j.1001-1609.hva.2020.08.022.
Research of the Impacts on TRV Caused by Parameters of the Supply Circuit in Shunt Reactor Current Switching Tests
In shunt reactor current switching tests of high voltage alternating circuit-breakers
the prospective TRV parameters determined by the parameters of the load circuit. However
the TRV parameters between the gap of the circuit-breaker will be impacted by the parameters of the supply circuit in real tests. The rational method for determining parameters of the supply circuit is the foundation for correctly checking the performance of switching shunt reactor of high-voltage alternating circuit-breakers. For a SF
6
circuit-breaker of 145 kV
analyzed the different impacts on TRV caused by various inductance and capacitance of supply circuit by simulating with PSCAD software. Concluded that the para
meters of the supply circuit will lead to the increase of peak value and RRRV of TRV
the increase of the inductance will enhance the increase of TRV
the increase of the capacitance in a certain range will weaken the increase of TRV. Further combining the results of real tests demonstrated the results from the simulation.