MU Yan, WANG Yongxing, ZOU Jiyan. Research on Reliability of Vacuum Circuit Breaker Based on Degradation[J]. High voltageapparatus, 2020, 56(10): 130-134+140.
MU Yan, WANG Yongxing, ZOU Jiyan. Research on Reliability of Vacuum Circuit Breaker Based on Degradation[J]. High voltageapparatus, 2020, 56(10): 130-134+140. DOI: 10.13296/j.1001-1609.hva.2020.10.021.
Research on Reliability of Vacuum Circuit Breaker Based on Degradation
As one of the terminal devices of the power system
the circuit breaker plays a role of control
regulation and protection
and its reliability level has an important influence on the stability of the power system.The focus of circuit breaker reliability research is on mechanical reliability.In order to make full use of the process information of the circuit breaker failure
this paper uses the degradation-based reliability modeling method to make tens of thousands of degradations test on six 12 kV permanent magnet mechanism vacuum circuit breakers.In the experiment
the principal component analysis method was used to determine the overtravel as the degradation amount to establish the degradation process model.According to the over-travel degradation data
the normal distribution and the Weibull distribution are used to establish the degradation distribution model respectively.The corresponding model parameters are obtained and the reliability function and reliability comparison curve are given.