Simulation Calculation on Breakdown Process of Open Contacts of Bus Disconnector During Withstand Voltage Test of GIS with Same Frequency and Phase-angle

LI Wenhui; YANG Dingge; HAN Yanhua; WU Jingfeng; SHANG Yu; LI Chenjie; HUANG Zongze; LI Jiangtao

doi:10.13296/j.1001-1609.hva.2021.05.014

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Simulation Calculation on Breakdown Process of Open Contacts of Bus Disconnector During Withstand Voltage Test of GIS with Same Frequency and Phase-angle

更新时间：2025-04-26

- Simulation Calculation on Breakdown Process of Open Contacts of Bus Disconnector During Withstand Voltage Test of GIS with Same Frequency and Phase-angle
- High VoltageApparatus Vol. 57, Issue 5, Pages: 101-107(2021)
- 作者机构：
  
  1. 国网陕西省电力科学研究院
  2. 西安交通大学电气工程学院
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2021.05.014
  CLC： TM595
- Published：2021
- 稿件说明：
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[1]李文慧,杨鼎革,韩彦华,吴经锋,尚宇,李晨颉,黄宗泽,李江涛.GIS同频同相耐压试验中母线隔离开关断口击穿过程仿真计算[J].高压电器,2021,57(05):101-107.

LI Wenhui, YANG Dingge, HAN Yanhua, et al. Simulation Calculation on Breakdown Process of Open Contacts of Bus Disconnector During Withstand Voltage Test of GIS with Same Frequency and Phase-angle[J]. High voltageapparatus, 2021, 57(5): 101-107.
[1]李文慧,杨鼎革,韩彦华,吴经锋,尚宇,李晨颉,黄宗泽,李江涛.GIS同频同相耐压试验中母线隔离开关断口击穿过程仿真计算[J].高压电器,2021,57(05):101-107. DOI： 10.13296/j.1001-1609.hva.2021.05.014.

LI Wenhui, YANG Dingge, HAN Yanhua, et al. Simulation Calculation on Breakdown Process of Open Contacts of Bus Disconnector During Withstand Voltage Test of GIS with Same Frequency and Phase-angle[J]. High voltageapparatus, 2021, 57(5): 101-107. DOI： 10.13296/j.1001-1609.hva.2021.05.014.

摘要

GIS设备同频同相耐压试验发生意外导致试验相母线隔离开关断口击穿时

试验间隔对应母线电压可能产生畸变

间隔保护可能误动。为评估该暂态过程对运行母线及试验侧串联谐振装置的影响

有必要对断口击穿暂态过程中各个关键节点的电压、电流波形进行仿真。建立了网侧真型和试验侧真型两种ATPEMTP仿真模型

对同频同相耐压试验失败导致母线隔离开关断口击穿后的暂态过程开展仿真计算

得到该过程中过电压、过电流波形及峰值

评估了两种模型的正确性及击穿过程对同频同相耐压试验的影响。仿真结果表明

网侧真型模型能更好地反映试验失败时产生的过电压、过电流。

Abstract

In case of breakdown across open contacts of bus disconnector of the test phase due to accident of same frequency and phase-angle withstand voltage test of GIS equipment

the corresponding bus voltage of the test bay may generate distortion and the protection bay may perform mal-operation.For assessing influence of the transient process on the operation bus and the series resonance device at the test side

it is necessary to simulate the voltage and current waveforms of each key node in the breakdown transient across open contacts.Such two types of ATP-EM-TP simulation models at grid side and test side true models are set up.The transient process after the breakdown across open contacts of bus disconnector due to failure of the same frequency and phase-angle withstand voltage test is simulated and calculated

the over voltage and over current waveform as well as peak during the process is obtained.The correctness of the two types of models and the influence of breakdown process on the same frequency and phase-angle withstand voltage test are evaluated.It is shown by the simulation result that the true model of the grid side can reflect the over voltage and overcurrent situation better in case of failure of the test.

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