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基于电场分布曲线的瓷质绝缘子零值检测技术研究
更新时间:2025-04-26
    • 基于电场分布曲线的瓷质绝缘子零值检测技术研究

    • High VoltageApparatus   Vol. 59, Issue 11, Pages: 74-83(2023)
    • DOI:10.13296/j.1001-1609.hva.2023.11.009    

      CLC: TM216
    • Published:2023

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  • [J]. High voltageapparatus, 2023, 59(11): 74-83. DOI: 10.13296/j.1001-1609.hva.2023.11.009.

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