Analysis and Treatment on Abnormal Over-stroke of Contacts of High-voltage Circuit Breaker

YANG Zheng; QIN Yan; CHEN Guang; LUO Zanchen; ZENG Xinghong; SONG Yunxiang; LI Gang

doi:10.13296/j.1001-1609.hva.2025.09.026

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Analysis and Treatment on Abnormal Over-stroke of Contacts of High-voltage Circuit Breaker

Technical Discussion | 更新时间：2025-09-05

- Analysis and Treatment on Abnormal Over-stroke of Contacts of High-voltage Circuit Breaker
- High Voltage Apparatus Vol. 61, Issue 9, Pages: 209-214(2025)
- 作者机构：
  
  中国南方电网有限责任公司超高压输电公司南宁局，南宁　530021
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2025.09.026
  CLC：
- Received：01 March 2025，
  
  Revised：10 May 2025，
  
  Published：16 September 2025
- 稿件说明：
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YANG Zheng, QIN Yan, CHEN Guang, et al. Analysis and Treatment on Abnormal Over-stroke of Contacts of High-voltage Circuit Breaker[J]. High voltage apparatus, 2025, 61(9): 209-214.
DOI：

YANG Zheng, QIN Yan, CHEN Guang, et al. Analysis and Treatment on Abnormal Over-stroke of Contacts of High-voltage Circuit Breaker[J]. High voltage apparatus, 2025, 61(9): 209-214. DOI： 10.13296/j.1001-1609.hva.2025.09.026.

摘要

文中介绍了一起252 kV SF

断路器触头超程异常的分析与处理。在机构更换过程中，通过慢分慢合试验测量灭弧室触头行程时，发现了超程偏大的故障。对机构、连杆装配及灭弧室等可能故障的环节展开分析，确认了灭弧室存在故障。通过对故障灭弧室解体分析，发现灭弧室动弧触指断裂是造成超程增大的直接原因，并通过电镜扫描和化学成分分析了动弧触指断裂的原因。该次故障的分析与处理，对SF

断路器行程异常相关的故障排查和处理具有借鉴意义。

Abstract

The analysis and treatment of abnormal over-stroke of 252 kV SF

circuit breaker is introduced in this paper. In the replacement process of operating mechanism

the fault of excessive over-stroke has been founded when measuring the contact stroke of interrupter by slow opening and slow closing operation. Such likely fault chains as operating mechanism

linkage assembly and interrupter are analyzed and the fault is confirmed in the interrupter. It is found through the disassembly analysis of the interrupter that the breakage of the moving arc contact finger is the main reason for the increase of the over-stroke. The cause of the breakage of the moving arc contact finger is analyzed by electron microscope scanning and chemical composition. The analysis and treatment of the fault have a reference for troubleshooting and treatment related to abnormal stroke of SF

circuit breaker.

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