Research Progress on Ablation Failure Mechanism and Prevention of Buffer Layer in High-voltage XLPE Cables

HAN Zhuozhan; TIAN Yi; HUANG Juntang; HUANG Jiasheng

doi:10.13296/j.1001-1609.hva.2026.10.017

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Research Progress on Ablation Failure Mechanism and Prevention of Buffer Layer in High-voltage XLPE Cables

Research & Analysis | 更新时间：2026-10-14

- Research Progress on Ablation Failure Mechanism and Prevention of Buffer Layer in High-voltage XLPE Cables
- High Voltage Apparatus Vol. 62, Issue 10, Pages: 140-156(2026)
- 作者机构：
  
  广东电网有限责任公司广州供电局，广州 510620
  西安工程大学西安市电气设备互联感知与智能诊断重点实验室，西安 710048
- 作者简介：
- 基金信息：
- DOI：10.13296/j.1001-1609.hva.2026.10.017
  CLC：
- Received：10 April 2026，
  
  Revised：2026-06-18，
  
  Published：16 October 2026
- 稿件说明：
移动端阅览
HAN Zhuozhan, TIAN Yi, HUANG Juntang, et al. Research Progress on Ablation Failure Mechanism and Prevention of Buffer Layer in High-voltage XLPE Cables[J]. High Voltage Apparatus, 2026, 62(10): 140-156.
DOI：

HAN Zhuozhan, TIAN Yi, HUANG Juntang, et al. Research Progress on Ablation Failure Mechanism and Prevention of Buffer Layer in High-voltage XLPE Cables[J]. High Voltage Apparatus, 2026, 62(10): 140-156. DOI： 10.13296/j.1001-1609.hva.2026.10.017.

摘要

近年来，皱纹铝护套结构的高压交联聚乙烯（XLPE）电缆阻水缓冲层烧蚀故障频发，对电力系统的安全稳定运行造成严重影响。针对高压XLPE电缆缓冲层烧蚀故障特征分析、检测方法和解决方案的研究得到了显著的关注。文中对不同类型缓冲层的基本结构进行了分析，梳理了缓冲层烧蚀的发展过程和烧蚀过程中伴随产生的物理化学特征。通过搭建的模拟烧蚀平台和不同工况下电缆等效电路模型和多物理场仿真模型进一步细化了烧蚀过程中伴随产生的物理特征：缓冲层受潮发展至烧蚀可以分为3个阶段，当缓冲层内含有气隙或白色粉末时就会影响缓冲层的电场强度、电压分布以及局部温升，因此局部放电现象会出现在缓冲层内部，除此之外，缓冲层表面一个周期的温度升高约至45℃，根据热平衡方程计算可得到白色粉末处的温度可达到一个周期的数倍。总结出了烧蚀发生的条件和关键影响因素，包括铝护套波谷压入深度、气隙间距、白色粉末的面积和厚度、接触不良长度等。此外，根据缓冲层烧蚀过程中伴随的物理特征信号和产物的检测手段对各种检测方法进行了对比分析，并从缓冲层修复和新型缓冲层两方面阐述了如何从根源去解决高压电缆缓冲层烧蚀故障。文中为优化缓冲层材料及结构，提高其耐烧蚀能力，开发缓冲层缺陷检测技术提供参考。

Abstract

In recent years

ablation failures of the water-blocking buffer layer in high-voltage cross-linked polyethylene(XLPE)cables with corrugated aluminum sheath structures have occurred frequently

causing serious impacts on the safe and stable operation of power systems. Significant attention has been paid to research on failure characteristic analysis

detection methods

and solution strategies for buffer layer ablation in high-voltage XLPE cables. In this paper

the basic structures of different types of buffer layers are analyzed

and the development process of buffer layer ablation as well as the accompanying physical and chemical characteristics generated during the ablation process are reviewed. Through the construction of a simulated ablation platform and cable equivalent circuit models under different operating conditions

as well as multi physics field simulation models

the physical characteristics that accompany the ablation process have been further refined. The development of the buffer layer from moisture to erosion can be divided into three stages. When air gaps or white powder are present in the buffer layer

they affect the electric field strength

voltage distribution

and local temperature rise within the buffer layer. As a result

partial discharge phenomena occur inside the buffer layer. In addition

the temperature on the buffer layer surface rises to approximately 45℃over one cycle. According to calculations based on the heat balance equation

the temperature at the locations where white powder is present can reach several times that of one cycle. The conditions and key influencing factors in case of ablation

including the depth of groove pressing into the aluminum sheath

air gap spacing

area and thickness of white powder

length of poor contact

are summarized. In addition

various detection methods are compared and analyzed based on the physical signature signals and byproduct detection techniques associated with the buffer layer ablation process. Moreover

solutions to fundamentally address the ablation failure of high-voltage cable buffer layers are discussed from such two perspectives as buffer layer repair and the development of novel buffer layer designs. This paper provides a reference for optimizing buffer layer materials and structures

improving their ablation resistance

and developing defect detection technologies for buffer layers.

关键词

Keywords

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